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oai:drum.lib.umd.edu:1903/27272016-03-29T05:43:18Zcom_1903_2234com_1903_1654com_1903_2col_1903_2765col_1903_3

Yang, Chia-Hung Li, Changyi Digital Repository at the University of Maryland University of Maryland (College Park, Md.) Electrical Engineering 2005-08-03T15:50:48Z 2005-08-03T15:50:48Z 2005-07-28 http://hdl.handle.net/1903/2727 In this thesis, we present the design and applications of a cryogenic atomic force microscope (AFM) for characterization of nanostructures. The cryogenic AFM with a conductive tip can measure DC current through nanostructures. We use quartz tuning fork (QTF) as the force sensor. Unique coarse z motor design provides reliable autoapporach in the Z direction. AFM imaging with 10nm horizontal and ~2 angstrom vertical resolution has been achieved. We have used this AFM in the current-voltage characterization of diodes, and, with a modified sensing mechanism, electrical force microscopy (EFM) and magnetic force microscopy (MFM) have been demonstrated. 3923753 bytes application/pdf en_US CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES Thesis Engineering, Electronics and Electrical AFM NDR single electron EFM MFM SPM open.access